简介:镓氮化物的大数量(轧)nanowires经由Ga2O3电影在一个石英试管在950点在氧化的铝层上扔了的ammoniating被准备了。当水晶的wurtzite由X光检查衍射,X光检查光电子spectrometry扫描电子显微镜和精选区域的电子衍射轧了,nanowires被证实了。传播电子显微镜(TEM)和扫描电子显微镜学(SEM)表明nanowires非结晶、不规则,与从30nm到直到十微米的80nm和长度的直径。精选区域的电子衍射显示有六角形的wurtzite结构的nanowire是单身者水晶。生长机制简短被讨论。
简介:采用挤压铸造方法制备了体积分数为55%、不同颗粒粒径增强的电子封装用SiCp/Cu复合材料,并分析了颗粒尺寸和热处理状态对材料物理性能和力学性能的影响规律.显微组织观察表明SiC颗粒分布均匀,复合材料组织致密;随着SiC颗粒尺寸的减小,复合材料的平均线膨胀系数和热导率均降低;退火处理可以降低复合材料的热膨胀系数,同时提高材料的热导率.复合材料具有高的弯曲强度和弹性模量,退火处理后材料的弯曲强度降低,但弹性模量变化不大.
简介:Usinganewlow-temperatureprocess(<600℃),thepoly-SiTFTwasfabricatedbymetal-inducedlateralcrystallization(MILC).Anultrathinaluminumlayerwasdepositedona-Sifilmandselectivelyformedbyphotolithography.Thefilmswerethenannealedat560℃toobtainlaterallycrystallizedpoly-Sifilm,whichisusedasthechannelareaofaTFT.Thepoly-SiTFTshowedanon/offcurrentratioofhigherthan1×106atadrainvoltageof5V.TheelectricalpropertiesaremuchbetterthanTFTfabricatedbyconventionalcrystallizationat600℃.
简介:TheinvestigationonopticalpropertiesofSi1-xGex/Sistrainedlayerstructureshasbeencarriedoutactivelyinrecentyears.Thephotoluminescencehasbe-comeabriskersubjectinthestudiesofitsvariousopticalproperties.Aresearchdevelop-menttophotoluminescencepropertiesofsomenewSi1-xGex/Sistrainedlayerstruc-turesisintroduced.
简介:Theresidualelectricallyactivedefectsin(4×1012cm-2(30KeV)+5×1012cm-2(130KeV))si-implantedLECundopedsi-GaAsactivatedbytwo-steprapidthermalannealing(RTA)LABELEDAS970℃(9S)+750℃(12S)havebeeninvestigatedwithdeepleveltransientspec-troscopy(DLTS).TwoelectrontrapsET1(Ec-0.53eV,σn=2.3×10-16cm2)andET2(Ec-0.81eV,σn=9.7×10(-13)cm2)aredetected.Furthermore,thenoticeablevariationsoftrap’scon-centrationandenergylevelintheforbiddengapwiththedepthprofileofdefectsinducedbyionim-plantationandRTAprocesshavealsobeenobserved.The[Asi·VAs·AsGa]and[VAs·Asi·VGa·AsGa]areproposedtobethepossibleatomicconfigurationsofET1andET2,respectivelytoexplaintheirRTAbehaviors.
简介:AninitialstructuredesignofMMI1×8opticalpowersplittersisreported.ThewaveguidematerialisSi-basedSiO2Ge-dopedanddepositedbyPECVDmethod.Embeddedstripstructureisimpliedinthesectiondesign.ByusingBPM-CAD,afavorableresultisobtainedthatthisdevicehasasounduniformityandfairlylowloss.Meanwhile,simulationsofdesignswithcertainchangedparametersisalsoimplementedforabetterdesignconfiguration.
简介:PhotoconductivityCharacteristicsofPorousSi①CHAOZhanyun,WANGKaiyuan(DepartmentofElectronicEnginering,SoutheastUniversity,Nanji...
简介:Anultrahighvacuumchemicalvapordeposition(UHV/CVD)systemisintroduced.SiGealloysandSiGe/Simultiplequantumwells(MQWs)havebeengrownbycold-wallUHV/CVDusingdisilane(Si2H6)andgermane(GeH4)asthereactantgasesonSi(100)substrates.ThegrowthrateandGecontentsinSiGealloysarestudiedatdifferenttemperatureanddifferentgasflow.ThegrowthrateofSiGealloyisdecreasedwiththeincreaseofGeH4flowathightemperature.X-raydiffractionmeasurementshowsthatSiGe/SiMQWshavegoodcrystallinity,sharpinterfaceanduniformity.Nodislocationisfoundintheobservationoftransmissionelectronmicroscopy(TEM)ofSiGe/SiMQWs.TheaveragedeviationofthethicknessandthefractionofGeinsingleSiGealloysampleare3.31%and2.01%,respectively.