学科分类
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1 个结果
  • 简介:SmallX-rayScattering(SAXS)experimentusingSynchrotronRadiationasX-raysourcewasusedtodeterminetheaveragewallthicknessofmesoporoussilicaprepardbycondensationoftetraethylorthosilicate(TEOS)usingnon-ionicalkylpolyethyleneoxide(AEO9)surfactantastemplates.Theresultsagreedwiththatofhigh-resolutionTEM(HRTEM)measurement.

  • 标签: 小角X射线散射分析 SAXS 中孔硅石 平均壁厚 结构分析