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2000年1期
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An XAFS measurement of copper thin film by a simple detector in total—electron—yield mode
An XAFS measurement of copper thin film by a simple detector in total—electron—yield mode
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摘要
未填写
DOI
54y951pkd0/1433352
作者
T.Liu Y.N.Xie 等
机构地区
不详
出处
《同步辐射装置用户科技论文集》
2000年1期
关键词
铜薄膜
XAFS
X射线吸收精细结构
结构分析
全电子产额技术
分类
[核科学技术][核技术及应用]
出版日期
2000年01月11日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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来源期刊
同步辐射装置用户科技论文集
2000年1期
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相关关键词
铜薄膜
XAFS
X射线吸收精细结构
结构分析
全电子产额技术
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