摘要
Theelectroluminescencethinfilmsdopedwitherbium,fabricatedbythermalevaporationwithtwoboats,areanalyzedbyX-raydiffraction(XRD).Therelationshipbetweenelectroluminescencebrightnessandmicrostructureofthethinfilmsisobtained.Theresultsrevealthatthelargegrainsizeinhighindexplaneofdepositedmicrocrystallinefilmhasaneffectonelectroluminescencecharacteristicsofthefilmdevices.
出版日期
2000年01月11日(中国期刊网平台首次上网日期,不代表论文的发表时间)